> Details

Jafari, Sahar [Author]; Steffens, Jonathan [Author]; Wendt, Michael [Author]; Terheiden, Barbara [Author]; Meyer, Sylke [Author]; Lausch, Dominik [Author]

Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures

Reference
management

Bookmarks

Remove from
bookmarks

Share this on Whatsapp

Close

Bookmarks



You can manage bookmarks using lists, please log in to your user account for this.
  • Media type: E-Book
  • Title: Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
  • Contributor: Jafari, Sahar [Author]; Steffens, Jonathan [Author]; Wendt, Michael [Author]; Terheiden, Barbara [Author]; Meyer, Sylke [Author]; Lausch, Dominik [Author]
  • Published: Konstanz: KOPS Universität Konstanz, 2020
  • Extent: 1 Online-Ressource
  • Language: English
  • Identifier:
  • Origination:
  • Footnote: In: Physica Status Solidi (B) - Basic Solid State Physics ; 257 (2020), 9. - 2000097. - Wiley. - ISSN 0370-1972. - eISSN 1521-3951
  • Access State: Open Access