Media type: Book Title: Failure mechanisms in semiconductor devices Contributor: Amerasekera, Ajith [Author]; Amerasekera, E. Ajith [Author]; Najm, Farid N. [Author] Published: Chichester [u.a.]: Wiley, 1997 Issue: 2. ed. Extent: XII, 345 S; Ill., graph. Darst; 24 cm Language: English ISBN: 0471954829 RVK notation: ZN 4800 : Allgemeines ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte Keywords: Halbleiterbauelement Origination: Footnote: Literaturangaben
Departmental Library DrePunct – open access area Shelf-mark: ZN 4040 A512(2) Item ID: 10362733 Status: Loanable