> Verlagsreihe
-
41:
Soft errors in modern electronic systems Michael Nicolaidis ed
New York; Heidelberg [u.a.]: Springer, 2011
-
42:
New methods of concurrent checking by Michael Goessel
[Dordrecht]: Springer, 2008
-
37:
Emerging nanotechnologies test, defect tolerance, and reliability Mohammad Tehranipoor ed
New York, NY: Springer, 2008
-
34:
Defect-oriented testing for nano-metric CMOS VLSI circuits by Manoj Sachdev; José Pineda de Gyvez
Dordrecht: Springer, 2007
-
27:
Advances in electronic testing challenges and methodologies ed. by Dimitris Gizopoulos
Dordrecht: Springer, 2006
-
32:
Fault tolerance techniques for SRAM based FPGAs by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis
Dordrecht: Springer, 2006
-
29:
Introduction to advanced system on chip test design and optimization by Erik Larsson
Dordrecht: Springer, 2005
-
30:
Fault diagnosis of analog integrated circuits Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha
Berlin; Heidelberg [u.a.]: Springer, 2005
-
22:
Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi
Boston [u.a.]: Kluwer Acad. Publ., 2003
-
23:
Fault injection techniques and tools for embedded systems reliability evaluation ed. by Alfredo Benso
Boston, Mass. [u.a.]: Kluwer Acad. Publ., 2003
-
19:
A designer's guide to built-in self-test Charles E. Stroud
Boston [u.a.]: Kluwer Academic Publishers, 2002
-
18:
Boundary scan interconnect diagnosis José T. de Sousa and Peter Y. K. Cheung
Boston: Kluwer Academic Publishers, 2001
-
17:
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Michael L. Bushnell; Vishwani D. Agrawal
Boston, Mass.; London [u.a.]: Kluwer Academic, 2000