Media type: Book Title: Lock-in thermography : basics and use for evaluating electronic devices and materials Contributor: Breitenstein, Otwin [Author]; Warta, Wilhelm [Author]; Langenkamp, Martin [Author] imprint: Berlin; Heidelberg: Springer, 2010 Published in: Advanced microelectronics ; 10 Issue: 2. ed. Extent: X, 255 S.; Ill., graph. Darst; 235 mm x 155 mm Language: English ISBN: 9783642024160; 9783642264788 Publisher, production or purchase order numbers: Sonstige Nummer: 12249428 RVK notation: ZQ 3820 : Temperaturmessung ZM 3700 : zerstörungsfreie ZN 4032 : Nichtelektrische Prüfverfahren Keywords: Infrarotthermographie Origination: Footnote:
Departmental Library DrePunct – open access area Shelf-mark: ZN 4032 B835(2) Item ID: 33220080 Status: Loanable