Seeck, O. H.
[Author];
Kaendler, I. D.
[Author];
Sinha, S. K.
[Author];
Tolan, M.
[Author];
Shin, K.
[Author];
Rafailovich, M. H.
[Author];
Sokolov, J.
[Author];
Kolb, R.
[Author]
Analysis of X-ray reflectivity data from low-contrast polymer bilayers using a Fourier method
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Media type:
E-Article
Title:
Analysis of X-ray reflectivity data from low-contrast polymer bilayers using a Fourier method
Contributor:
Seeck, O. H.
[Author];
Kaendler, I. D.
[Author];
Sinha, S. K.
[Author];
Tolan, M.
[Author];
Shin, K.
[Author];
Rafailovich, M. H.
[Author];
Sokolov, J.
[Author];
Kolb, R.
[Author]
imprint:
American Institute of Physics, 2000
Published in:Applied physics letters 76, 2713 - 2715 (2000).
Language:
English
ISSN:
0003-6951
Origination:
Footnote:
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