Media type: E-Article Title: Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy Contributor: Kawai, Shigeki; Glatzel, Thilo; Hug, Hans-Josef; Meyer, Ernst imprint: IOP Publishing, 2010 Published in: Nanotechnology Language: Not determined DOI: 10.1088/0957-4484/21/24/245704 ISSN: 1361-6528; 0957-4484 Keywords: Electrical and Electronic Engineering ; Mechanical Engineering ; Mechanics of Materials ; General Materials Science ; General Chemistry ; Bioengineering Origination: Footnote: