Media type: E-Article Title: Study of Lowenergy Atomic Mixing by Means of Auger Depth Profiling, XTEM and TRIM Simulation on GeSi Multilayer System Contributor: Barna, A.; Menyhard, M. imprint: Wiley, 1996 Published in: Surface and Interface Analysis Language: Not determined DOI: 10.1002/(sici)1096-9918(199607)24:7<476::aid-sia138>3.3.co;2-6 ISSN: 0142-2421; 1096-9918 Keywords: Materials Chemistry ; Surfaces, Coatings and Films ; Surfaces and Interfaces ; Condensed Matter Physics ; General Chemistry Origination: Footnote: