Media type: E-Article Title: Non-destructive depth profile analysis using synchrotron radiation excited XPS Contributor: Zier, Michael; Oswald, Steffen; Reiche, Rainer; Wetzig, Klaus imprint: Springer Science and Business Media LLC, 2006 Published in: Microchimica Acta Language: English DOI: 10.1007/s00604-006-0615-9 ISSN: 0026-3672; 1436-5073 Keywords: Analytical Chemistry Origination: Footnote: