Media type: E-Article Title: Synchrotron X-Ray Topography Studies of the Evolution of the Defect Microstructure in Physical Vapor Transport Grown 4H-SiC Single Crystals Contributor: Dudley, Michael; Raghothamachar, Balaji; Wang, Huanhuan; Wu, Fangzhen; Byrappa, Shayan; Chung, Gil; Sanchez, Edward K; Mueller, Stephan; Hansen, Darren; Loboda, Mark imprint: The Electrochemical Society, 2013 Published in: ECS Meeting Abstracts Language: Not determined DOI: 10.1149/ma2013-02/25/1938 ISSN: 2151-2043 Keywords: General Medicine Origination: Footnote: Description: <jats:p>Abstract not Available.</jats:p> Access State: Open Access