Media type: E-Article Title: Analysis and Comparison of High-Resolution GS/s Samplers in Advanced BiCMOS and CMOS Contributor: Lal, Deeksha; Ali, Ahmed M. A.; Ricketts, David S. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2018 Published in: IEEE Transactions on Circuits and Systems II: Express Briefs Language: Not determined DOI: 10.1109/tcsii.2018.2822785 ISSN: 1558-3791; 1549-7747 Keywords: Electrical and Electronic Engineering Origination: Footnote: