Media type: E-Article Title: Thermal Stability and Failure Mechanism of Schottky Gate AlGaN/GaN HEMTs Contributor: Mocanu, Manuela; Unger, Christian; Pfost, Martin; Waltereit, Patrick; Reiner, Richard Published: Institute of Electrical and Electronics Engineers (IEEE), 2017 Published in: IEEE Transactions on Electron Devices, 64 (2017) 3, Seite 848-855 Language: Not determined DOI: 10.1109/ted.2016.2633725 ISSN: 0018-9383; 1557-9646 Origination: Footnote: