Media type: E-Article Title: Understanding the Resistive Switching Mechanism of 2-D RRAM: Monte Carlo Modeling and a Proposed Application for Reliability Research Contributor: Huang, Yifu; Gu, Yuqian; Chang, Yao-Feng; Chen, Ying-Chen; Akinwande, Deji; Lee, Jack C. Published: Institute of Electrical and Electronics Engineers (IEEE), 2023 Published in: IEEE Transactions on Electron Devices, 70 (2023) 4, Seite 1676-1681 Language: Not determined DOI: 10.1109/ted.2023.3249139 ISSN: 0018-9383; 1557-9646 Origination: Footnote: