Media type: E-Article Title: Highly Reliable and Secure PUF Using Resistive Memory Integrated Into a 28 nm CMOS Process Contributor: Esatu, Tsegereda K.; Prakash, Amit; Li, Zhi; Lau, Derek; Jo, Sung Hyun; Liu, Tsu-Jae King imprint: Institute of Electrical and Electronics Engineers (IEEE), 2023 Published in: IEEE Transactions on Electron Devices Language: Not determined DOI: 10.1109/ted.2023.3251953 ISSN: 0018-9383; 1557-9646 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: