• Media type: E-Article
  • Title: Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors
  • Contributor: Bronckers, Stephane; Van der Plas, Geert; Vandersteen, Gerd; Rolain, Yves
  • imprint: Institute of Electrical and Electronics Engineers (IEEE), 2010
  • Published in: IEEE Transactions on Instrumentation and Measurement
  • Language: Not determined
  • DOI: 10.1109/tim.2009.2024370
  • ISSN: 0018-9456; 1557-9662
  • Keywords: Electrical and Electronic Engineering ; Instrumentation
  • Origination:
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