Media type: E-Article Title: An Unsupervised Bayesian OC-SVM Approach for Early Degradation Detection, Thresholding, and Fault Prediction in Machinery Monitoring Contributor: Fong, Stanley; Narasimhan, Sriram Published: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Transactions on Instrumentation and Measurement, 71 (2022), Seite 1-11 Language: Not determined DOI: 10.1109/tim.2021.3137858 ISSN: 1557-9662; 0018-9456 Origination: Footnote: