Media type: E-Article Title: Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects Contributor: Ferraro, Rudy; Alia, Ruben Garcia; Danzeca, Salvatore; Masi, Alessandro imprint: Institute of Electrical and Electronics Engineers (IEEE), 2021 Published in: IEEE Transactions on Nuclear Science Language: Not determined DOI: 10.1109/tns.2021.3082646 ISSN: 0018-9499; 1558-1578 Keywords: Electrical and Electronic Engineering ; Nuclear Energy and Engineering ; Nuclear and High Energy Physics Origination: Footnote: