• Media type: E-Article
  • Title: Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
  • Contributor: Shen, Fan; Chen, Jianjun; Chi, Yaqing; Liang, Bin; Sun, Hanhan; Wen, Yi; Guo, Hao; Wang, Xun
  • imprint: Institute of Electrical and Electronics Engineers (IEEE), 2024
  • Published in: IEEE Transactions on Nuclear Science
  • Language: Not determined
  • DOI: 10.1109/tns.2023.3322594
  • ISSN: 0018-9499; 1558-1578
  • Origination:
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