Media type: E-Article Title: Interconnection lengths and VLSI Contributor: Ferry, David K. imprint: Institute of Electrical and Electronics Engineers (IEEE), 1985 Published in: IEEE Circuits and Devices Magazine Language: Not determined DOI: 10.1109/mcd.1985.6311992 ISSN: 8755-3996 Keywords: Electrical and Electronic Engineering ; Instrumentation ; Electronic, Optical and Magnetic Materials Origination: Footnote: