Media type: E-Article Title: Measurement of material surface defect intensity by distributed cumulative histogram and clustering Contributor: Melnyk, Roman; Kvit, Roman Published: Private Company Technology Center, 2020 Published in: Technology audit and production reserves, 4 (2020) 2(54), Seite 36-45 Language: Not determined DOI: 10.15587/2706-5448.2020.210151 ISSN: 2706-5448; 2664-9969 Keywords: General Computer Science Origination: Footnote: Access State: Open Access