Media type: E-Article Title: Time Division Multiplexing based Test Access for Stacked ICs Contributor: Ansari, Muhammad Adil; Solnagi, Umair Saeed; Kim, Jinuk; Bughio, Ahsin Murtaza; Park, Sungju imprint: The Institute of Electronics Engineers of Korea, 2019 Published in: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Language: English DOI: 10.5573/jsts.2019.19.1.087 ISSN: 1598-1657; 2233-4866 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: Access State: Open Access