> Verlagsreihe
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Band 6:
Herstellung ultra-dünner hoch-[epsilon]r Oxide und deren Verhalten unter dynamischen elektrischen Stressbedingungen Steve Knebel
Berlin: Logos Verlag, [2019]
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Band 5:
Scanning spreading resistance microscopy and its application to passive and active semiconductor device characterization Stefan Döring
Berlin: Logos Verlag, 2017
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Band 4:
Electrical characterisation of ferroelectric field effect transistors based on ferroelectric HfO2 thin films Ekaterina Yurchuk
Berlin: Logos Verlag, 2015
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3:
Ultrathin calcium titanate capacitors physics and application Andreas Krause
Berlin: Logos-Verl., 2014
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2:
Leakage current and defect characterization of short channel MOSFETs Guntrade Roll
Berlin: Logos-Verl., 2012