• Medientyp: E-Book; Konferenzbericht
  • Titel: Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980
  • Weitere Titel: Nebentitel: IEEE 1980 International Reliability Physics
    Variant title from electronic version: Reliability Physics Symposium, 1980, 18th Annual
  • Körperschaft: IEEE Electron Devices Society ; IEEE Reliability Society
  • Erschienen: New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011
    [S.l.]: HathiTrust Digital Library
  • Umfang: 1 Online-Ressource (vii, 339 pages); illustrations, portraits
  • Sprache: Englisch
  • Schlagwörter: Integrated circuits Testing Congresses ; Semiconductors Testing Congresses ; Integrated circuits Reliability Congresses ; Semiconductors Reliability Congresses ; Konferenzschrift
  • Hersteller der Reproduktion: [S.l.]: HathiTrust Digital Library
  • Reproduktionsnotiz: Electronic reproduction
  • Entstehung:
  • Anmerkungen: "IEEE catalog no. 80CH1531-3
    Includes bibliographical references
    Use copy Restrictions unspecified star MiAaHDL
    Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002