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Henisch, Heinz K. [Author]

Semiconductor contacts : an approach to ideas and models - [Reprinted]

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Oxford: Clarendon Pr., 1985

Published in: International series of monographs on physics ; 70,r
Batra, Inder P. [Editor] ; NATO Division of Scientific Affairs, Advanced Research Workshop on Metallization and Metal Semiconductor Interfaces 1988 Garching b. München

Metallization and metal semiconductor interfaces : [proceedings of a NATO Advanced Research Workshop on Metallization and Metal Semiconductor Interfaces, Aug. 22 - 26, 1988, Garching]

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New York, NY [u.a.]: Plenum Pr., 1989

Published in: NATO: NATO ASI series / B ; 195
Henisch, Heinz K. [Author]; Henisch, Heinz Kurt [Author]

Semiconductor contacts : an approach to ideas and models

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Oxford [Oxfordshire]: Clarendon Press, 1984

Published in: International series of monographs on physics ; 70
Prank, Ulrich [Author]

Metall-Halbleiter-Metall-Reflexionsmodulatoren und Photodetektoren für die Mikrowellen-Optoelektronik - [Als Ms. gedr.]

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Düsseldorf: VDI-Verl., 1993

Published in: Verein Deutscher Ingenieure: Fortschrittberichte VDI / 9 ; 153
Rhoderick, Emlyn H. [Author]; Rhoderick, Emlyn Huw [Author]; Williams, R. H. [Author]

Metal-semiconductor contacts - [2. ed.]

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Oxford [u.a.]: Clarendon Pr., 1988

Published in: Monographs in electrical and electronic engineering ; 1902
Katz, Avishay [Editor]

Advanced metallizations in microelectronics : symposium held April 16 - 20, 1990, San Francisco, California, U.S.A.

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Pittsburgh, Pa.: Materials Research Society, 1990

Published in: Materials Research Society: Materials Research Society symposium proceedings ; 18100
Fionova, L. K. [Author]; Fionova, Ljudmila K. [Author]; Artemyev, A. V. [Author]

Grain boundaries in metals and semiconductors

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Les Ulis Cedex: Les Éditions de Physique, 1993

Published in: Monographies de physique
Feste, S. F. [Author]; Knoch, J. [Author]; Buca, D. [Author]; Zhao, Q. T. [Author]; Breuer, U. [Author]; Mantl, S. [Author]

Formation of steep, low Schottky-barrier contacts by dopant segregation during nickel silicidation

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American Institute of Physics, 2010

Published in: Journal of applied physics 107, 044510-6 (2010). doi:10.1063/1.3284089
European Workshop: Materials for Advanced Metallization (1997 :Villard-de-Lans, France), France Ministère de l'éducation nationale, de l'enseignement supérieur, de la recherche et de l'insertion professionnelle, International Union for Vacuum Science, Technique and Applications, IEEE Electron Devices Society

MAM '97, abstracts booklet : European Workshop: Materials for Advanced Metallization, Villard-de-Lans, France, March 16-19, 1997

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Paris, France: Société française du vide, 2010 ; [S.l.]: HathiTrust Digital Library
Shen, W. [Author]; Dittmann, R. [Author]; Breuer, U. [Author]; Waser, R. [Author]

Improved endurance behavior of resistive switching in (Ba,Sr)TiO3 thin films with W top electrode

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American Institute of Physics, 2008

Published in: Applied physics letters 93, 222102-1 (2008). doi:10.1063/1.3039809
Xu, C. [Author]; Heinemeyer, F. [Author]; Dittrich, A. [Author]; Bäumer, C. [Author]; Reineke-Koch, R. [Author]

In situ spectroscopic ellipsometry as a pathway toward achieving VO2stoichiometry for amorphous vanadium oxide with magnetron sputtering - [published Version]

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New York, NY : American Inst. of Physics, 2021

Published in: AIP Advances 11 (2021), Nr. 3 ; AIP Advances

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Skip to contents

Semiconductor contacts : an approach to ideas and models - [Reprinted]

Bookmarks

Metallization and metal semiconductor interfaces : [proceedings of a NATO Advanced Research Workshop on Metallization and Metal Semiconductor Interfaces, Aug. 22 - 26, 1988, Garching]

Bookmarks

Semiconductor contacts : an approach to ideas and models

Bookmarks

Metall-Halbleiter-Metall-Reflexionsmodulatoren und Photodetektoren für die Mikrowellen-Optoelektronik - [Als Ms. gedr.]

Bookmarks

Metal-semiconductor contacts - [2. ed.]

Bookmarks

Advanced metallizations in microelectronics : symposium held April 16 - 20, 1990, San Francisco, California, U.S.A.

Bookmarks

Grain boundaries in metals and semiconductors

Bookmarks

Formation of steep, low Schottky-barrier contacts by dopant segregation during nickel silicidation

Access

Bookmarks

MAM '97, abstracts booklet : European Workshop: Materials for Advanced Metallization, Villard-de-Lans, France, March 16-19, 1997

Access

Bookmarks

Improved endurance behavior of resistive switching in (Ba,Sr)TiO3 thin films with W top electrode

Access

Bookmarks

In situ spectroscopic ellipsometry as a pathway toward achieving VO2stoichiometry for amorphous vanadium oxide with magnetron sputtering - [published Version]

Access

Bookmarks

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