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Tjong, Sie Chin [Editor]

Nanocrystalline materials : their synthesis-structure-property relationships and applications - [Second edition]

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Amsterdam; Boston; Heidelberg: Elsevier, 2014

Published in: Elsevier insights
Brotherton, Stan D. [Author] ; Brotherton, S.D [Other]

Introduction to thin film transistors : physics and technology of TFTs

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Cham; Heidelberg [u.a.]: Springer, 2013
Fritzsche, Monika [Author]

Selbstorganisierte Nanostrukturen auf Germanium und Galliumantimonid und ihre Nutzung als Template

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2013
Ramm, Peter [Editor]; Lu, James Jian-Qiang [Other]; Taklo, Maaike M. V. [Other]

Handbook of wafer bonding

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Weinheim: Wiley-VCH-Verl., 2012
Dennler, G. [Editor] ; Advanced Materials and Concepts for Photovoltaics Conference 2007 Straßburg, European Materials Research Society

Proceedings on Advanced Materials and Concepts for Photovoltaics : EMRS 2007 Conference, Strasberg, France

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Amsterdam [u.a.]: Elsevier, 2008

Published in: European Materials Research Society: European Materials Research Society symposia proceedings ; 215
Ellmer, Klaus [Editor]; Klein, Andreas [Other]; Rech, Bernd [Other]

Transparent conductive zinc oxide : basics and applications in thin film solar cells

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Berlin; Heidelberg [u.a.]: Springer, 2008

Published in: Springer series in materials science ; 104
Tjong, S. C. [Author]

Nanocrystalline materials : their synthesis-structure-property relationships and applications - [1. ed.]

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Amsterdam; Heidelberg [u.a.]: Elsevier, 2006
Mönch, Winfried [Author]

Semiconductor surfaces and interfaces - [3., rev. ed]

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Berlin; Heidelberg [u.a.]: Springer, 2001

Published in: Springer series in surface sciences ; 26.2001
Graff, Klaus [Author]

Metal impurities in silicon-device fabrication - [2., rev. ed.]

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Berlin; Heidelberg; New York; Barcelona; Hong Kong; London; Milan; Paris; Singapore; Tokyo: Springer, 2000

Published in: Springer series in materials science ; 24.2000
Franzka, Steffen [Author]

Rasterkraftmikroskopische Untersuchungen zur Reibung von Silicium- und Al 2 O 3-Einkristalloberflächen im Kontakt mit Silicium

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Karlsruhe: Institut für Keramik im Maschinenbau Universität Karlsruhe, 1999

Published in: Institut für Keramik im Maschinenbau: IKM ; 27
Da̧browski, Jarek [Author]; Müssig, Hans-Joachim [Author]

Silicon surfaces and formation of interfaces : basic science in the industrial world

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Singapore [u.a.]: World Scientific, 2000
Sugawara, Minoru [Author] ; Stansfield, Barry L. [Other]

Plasma etching : fundamentals and applications

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Oxford [u.a.]: Oxford University Press, 1998

Published in: Series on semiconductor science and technology ; 7
Jones, Anthony C. [Author]; O'Brien, Paul [Author]

CVD of compound semiconductors : precursor synthesis, development and applications

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Weinheim [u.a.]: VCH, 1997
Prost, Werner [Author]

Technologie der III/V-Halbleiter : III/V-Heterostrukturen und elektronische Höchstfrequenz-Bauelemente

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Berlin; Heidelberg [u.a.]: Springer, 1997
Mack, Stefan [Author]

Eine vergleichende Untersuchung der physikalisch-chemischen Prozesse an der Grenzschicht direkt und anodisch verbundener Festkörper

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Düsseldorf: VDI-Verl., 1997

Published in: Verein Deutscher Ingenieure: Fortschritt-Berichte VDI ; 43600
Mönch, Winfried [Author]

Semiconductor surfaces and interfaces - [2. ed.]

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Berlin; Heidelberg [u.a.]: Springer, 1995

Published in: Springer series in surface sciences ; 26.1995
Pietsch, Georg J. [Author]

Struktur und Chemie technologischer Siliciumoberflächen - [Als Ms. gedr.]

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Düsseldorf: VDI-Verl., 1992

Published in: Verein Deutscher Ingenieure: Fortschrittberichte VDI / 9 ; 148
Cherns, David [Editor] ; Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy 1988 Bristol

Evaluation of advanced semiconductor materials by electron microscopy : [proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12 - 17, 1988, in Bristol, United Kingdon]

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New York [u.a.]: Plenum Press, 1989

Published in: NATO: NATO ASI series / B ; 203
Holt, David B. [Editor]; Joy, D. C. [Other]

SEM microcharacterization of semiconductors

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London [u.a.]: Academic Pr., 1989

Published in: Techniques of physics ; 1200
Bechstedt, Friedhelm [Author]; Enderlein, Rolf [Author]

Semiconductor surfaces and interfaces : their atomic and electronic structures ; with 51 tables

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Berlin: Akademie-Verl., 1988

Published in: Physical research ; 5

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