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  1. Rathore, Hazara S. [Editor]; Mathad, G. S. [Other] ; Symposium on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown 1991 Phoenix, Ariz, Electrochemical Society, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division, Symposium on Laser Process for Microelectronic Applications 1991 Phoenix, Ariz

    Proceedings of the Symposia on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications : [... joint volume of conference papers]

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    Pennington, NJ: Electrochemical Society, 1992

    Published in: Electrochemical Society: Proceedings volume ; 92,4

  2. McKerrow, Andrew J. [Other] ; Symposium Materials, Technology and Reliability for Advanced Interconnects and Low k Dielectrics 2003 San Francisco, Calif

    Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 21 - 25, 2003, San Francisco, California, U.S.A. ; [Symposium E, held at the 2003 MRS spring meeting]

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    Warrendale, Pa.: Materials Research Society, 2003

    Published in: Materials Research Society: Materials Research Society symposium proceedings ; 76600

  3. International Reliability Physics Symposium (17th :1979 :San Francisco, Calif.), IEEE Electron Devices Society, IEEE Reliability Group

    Reliability physics 1979 : 17th annual proceedings : San Francisco, California, April 24-26, 1979

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    New York: IEEE Electron Devices Society, 2011 ; [S.l.]: HathiTrust Digital Library

  4. International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.), IEEE Electron Devices Society, IEEE Reliability Society

    Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980

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    New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011 ; [S.l.]: HathiTrust Digital Library

  5. International Reliability Physics Symposium (16th :1978 :San Diego, Calif.), IEEE Electron Devices Society, IEEE Reliability Group

    Reliability physics 1978 : 16th annual proceedings : San Diego, California, April 18-20, 1978

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    New York: IEEE Electroni Devices Society, 1978

  6. JEDEC, Solid State Technology Association Committee on GaAs Reliability and Quality Standards, IEEE Electron Devices Society

    Reliability of compound semiconductors : ROCS Workshop, 2006 ; Nov. 12, 2006, San Antonio, Texas ; proceedings

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    Piscataway, NJ: IEEE, 2006

  7. ROCS Workshop (2005 :Palm Springs, Calif.), IEEE Electron Devices Society, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards

    2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

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    Arlington, Va; Piscataway, N.J: JEDEC, 2005

  8. GaAs Reliability Workshop (2003 :San Diego, Calif.), IEEE Electron Devices Society, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards

    2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California

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    Arlington, Va; Piscataway, N.J: JEDEC, 2003

  9. GaAs Reliability Workshop (2001 :Baltimore, Md.), IEEE Electron Devices Society, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards

    2001 GaAs Reliability Workshop : proceedings : October 21, 2001, Baltimore, Maryland

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    Arlington, Va; Piscataway, N.J: JEDEC, 2001

  10. Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society

    2014 IEEE International Integrated Reliability Workshop final report (IIRW) : 12 - 16 Oct. 2014, Stanford Sierra Conference Center, South Lake Tahoe, California, USA

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    Piscataway, NJ: IEEE, 2014