Borrione, Dominique
[Editor]
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DATE 1999 München,
European Design Automation Association,
Electronic Design Automation Consortium,
IEEEComputerSocietyTestTechnologyTechnical Committee,
Association for Computing Machinery Special Interest Group on Design Automation
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Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2004
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IEEEComputerSocietyTestTechnologyTechnicalCouncil
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Piscataway, NJ: IEEE, 2008
Abadir, Magdy S.
[Other]
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International Workshop on Microprocessor Test and Verification 5 2004 Austin, Tex,
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Piscataway, NJ: IEEE, 2009
Bolchini, Christiana
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IEEEComputerSocietyTestTechnologyTechnicalCouncil,
IEEE Computer Society Technical Committee on Fault Tolerant Computing
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Piscataway, NJ: IEEE, 2008
Bolchini, Christiana
[Other]
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IEEEComputerSocietyTestTechnologyTechnicalCouncil,
IEEE Computer Society Technical Committee on Fault Tolerant Computing
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Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2006
Menon, Sankaran
[Other]
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International Workshop on Current and Defect Based Testing 2004 Napa, Calif,
IEEEComputerSocietyTestTechnologyTechnical Committee
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Piscataway, NJ: IEEE Operations Center, 2004
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Los Alamitos, Calif. [u.a.]: IEEE Computer Society, c2007
Workshop on Signal Propagation on Interconnects 11 2007 Camogli,
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Piscataway, NJ: IEEE, 2007
Workshop on Signal Propagation on Interconnects 10 2006 Berlin,
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Workshop on Signal Propagation on Interconnects 9 2005 Garmisch-Partenkirchen,
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