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  1. Borrione, Dominique [Editor] ; DATE 1999 München, European Design Automation Association, Electronic Design Automation Consortium, IEEE Computer Society Test Technology Technical Committee, Association for Computing Machinery Special Interest Group on Design Automation

    Design, Automation and Test in Europe Conference and Exhibition 1999 : proceedings, Munich, Germany, March 9 - 12, 1999

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 1999

  2. IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee

    IEEE International High Level Design Validation and Test Workshop, 2008 : HLDVT '08 ; Incline Village, Nevada, USA, 19 - 21 Nov. 2008

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    Piscataway, NJ: IEEE, 2008

  3. IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee

    IEEE International High Level Design Validation and Test Workshop, 2007 : HLVDT 2007 ; Irvine, CA, 7 - 9 Nov. 2007

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    Piscataway, NJ: IEEE, 2007

  4. Metra, Cecilia [Other] ; International On-Line Testing Symposium 11 2005 Saint-Raphae͏̈l, IEEE Computer Society Test Technology Technical Council

    11th IEEE International On-Line Testing Symposium, 2005 : IOLTS 2005 ; 6 - 8 July 2005, [Saint Raphael, French Riviera, France ; proceedings]

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2005

  5. Metra, Cecilia [Other] ; International On-Line Testing Symposium 10 2004 Funchal, IEEE Computer Society Test Technology Technical Council

    Proceedings / 10th IEEE International On-Line Testing Symposium, IOLTS 2004 : 12 - 14 July 2004, Funchal, Madeira Island, Portugal

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2004

  6. Components, Packaging, and Manufacturing Technology Society Technical Committee on Electrical Design, Modeling and Simulation, IEEE Computer Society Test Technology Technical Council

    12th IEEE Workshop on Signal Propagation on Interconnects, 2008 : SPI 2008 ; Avignon, France, 12 - 15 May 2008

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    Piscataway, NJ: IEEE, 2008

  7. Abadir, Magdy S. [Other] ; International Workshop on Microprocessor Test and Verification 5 2004 Austin, Tex, IEEE Computer Society Test Technology Technical Council

    Fifth International Workshop on Microprocessor Test and Verification, 2004 : 9 - 10 Sept. 2004, [Austin, Texas ; common challenges and solutions ; proceedings]

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2005

  8. Gizopoulos, Dimitris [Other] ; IEEE Computer Society Technical Committee on Fault Tolerant Computing, IEEE Computer Society Test Technology Technical Council

    24th [i.e. 22nd] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009 : DFT '09 ; 7 - 9 Oct. 2009, Chicago, Illinois ; proceedings

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    Piscataway, NJ: IEEE, 2009

  9. Bolchini, Christiana [Other] ; IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

    IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008 : DFTVS '08 ; 1 - 3 Oct. 2008, [Cambridge], Boston, Massachusetts

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    Piscataway, NJ: IEEE, 2008

  10. Bolchini, Christiana [Other] ; IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

    22nd [i.e. 20th] IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, 2007 : DFT '07 ; 26 - 28 Sept. 2007, Rome, Italy ; proceedings

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2007

  11. Park, Nohpill [Other] ; IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault Tolerant Computing

    21st [i.e. 19th] IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006 : DFT '06 ; October 4 - 6, 2006, Arlington, Virginia, USA ; proceedings

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2006

  12. Menon, Sankaran [Other] ; International Workshop on Current and Defect Based Testing 2004 Napa, Calif, IEEE Computer Society Test Technology Technical Committee

    Proceedings / 2004 IEEE International Workshop on Current & Defect Based Testing, DBT 2004 : 25 April 2004, [Napa Valley Marriott, Napa Valley, CA, USA]

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    Piscataway, NJ: IEEE Operations Center, 2004

  13. IEEE Computer Society Design Automation Technical Committee, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Test Technology Technical Council

    IEEE International Conference on Microelectronic Systems Education, 2007 : MSE '07 ; 3 - 4 June 2007, San Diego, CA

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, c2007

  14. Workshop on Signal Propagation on Interconnects 11 2007 Camogli, Components, Packaging, and Manufacturing Technology Society Technical Committee on Electrical Design, Modeling and Simulation, IEEE Computer Society Test Technology Technical Council

    IEEE Workshop on Signal Propagation on Interconnects, 2007 : SPI 2007 ; Ruta di Camogli, Italy, 13 - 16 May 2007

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    Piscataway, NJ: IEEE, 2007

  15. Workshop on Signal Propagation on Interconnects 10 2006 Berlin, Components, Packaging, and Manufacturing Technology Society Technical Committee on Electrical Design, Modeling and Simulation, IEEE Computer Society Test Technology Technical Council

    IEEE Workshop on Signal Propagation on Interconnects, 2006 : May [9 - 12], 2006, ["Dorint Sofitel Schweizerhof Berlin", Berlin, Germany ; proceedings]

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    Piscataway, NJ: IEEE Service Center, 2006

  16. Workshop on Signal Propagation on Interconnects 9 2005 Garmisch-Partenkirchen, Components, Packaging, and Manufacturing Technology Society Technical Committee on Electrical Design, Modeling and Simulation, IEEE Computer Society Test Technology Technical Council

    Proceedings / 9th IEEE Workshop on Signal Propagation on Interconnects, 2005 : [May 10 - 13, 2005, Hotel "Dorint", Garmisch-Partenkirchen, Germany]

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    Piscataway, NJ: IEEE Service Center, 2005

  17. IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI, Qinghua-Daxue Taipeh

    IEEE International Workshop on Memory Technology, Design, and Testing, 2006 : MTDT '06 ; 2 - 4 Aug. 2006, Taipei, Taiwan ; proceedings

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    Piscataway, NJ: IEEE, 2006

  18. International Workshop on Electronic Design, Test and Applications 2 2004 Perth, Western Australia, IEEE Computer Society Test Technology Technical Council

    Second IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004, 28 - 30 January 2004, [Perth, Australia ; proceedings]

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Soc., 2004

  19. Sekanina, Lukáš [Other] ; IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

    IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 : 8 - 10 April 2013, Karlovy Vary, Czech Republic

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    Piscataway, NJ: IEEE, 2013

  20. Raik, Jaan [Other] ; IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

    IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 : 18 - 20 April 2012, Tallin, Estonia

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    Piscataway, NJ: IEEE, 2012