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  1. Giannazzo, F.; Raineri, V.; Mirabella, S.; Impellizzeri, G.; Priolo, F.; Fedele, M.; Mucciato, R.

    Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures

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    American Vacuum Society, 2006

    Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 24 (2006) 1, Seite 370-374

  2. Basnar, B.; Golka, S.; Gornik, E.; Harasek, S.; Bertagnolli, E.; Schatzmayr, M.; Smoliner, J.

    Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers

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    American Vacuum Society, 2001

    Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 19 (2001) 5, Seite 1808-1812